• DocumentCode
    1282290
  • Title

    Automatic image analysis for detecting and quantifying gamma-ray sources in coded-aperture images

  • Author

    Schaich, Paul C. ; Clark, Gregory A. ; Sengupta, Sailes K. ; Ziock, Klaus-Peter

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    43
  • Issue
    4
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    2419
  • Lastpage
    2426
  • Abstract
    We report the development of an automatic image analysis system that detects gamma-ray source regions in images obtained from a coded aperture, gamma-ray imager. The number of gamma sources in the image is not known prior to analysis. The system counts the number (K) of gamma sources detected in the image and estimates the lower bound for the probability that the number of sources in the image is K. The system consists of a two-stage pattern classification scheme in which the probabilistic neural network is used in the supervised learning mode. The algorithms were developed and tested using real gamma-ray images from controlled experiments in which the number and location of depleted uranium source disks in the scene are known. The novelty of the work lies in the creative combination of algorithms and the successful application of the algorithms to real images of gamma-ray sources
  • Keywords
    detector circuits; gamma-ray detection; high energy physics instrumentation computing; image classification; learning (artificial intelligence); neural nets; nuclear electronics; radioactive sources; automatic image analysis; coded-aperture images; depleted uranium source disks; gamma-ray source detection; probabilistic neural network; real images; supervised learning mode; two-stage pattern classification scheme; Apertures; Cameras; Gamma ray detection; Gamma ray detectors; Image analysis; Image processing; Laboratories; Nuclear imaging; Pattern recognition; Probability;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.531791
  • Filename
    531791