• DocumentCode
    1284863
  • Title

    5.6 Gb/s receiver with electrical overstress protection for GDDR in a 45 nm CMOS

  • Author

    Sumesaglam, Taner ; Song, Rachel ; Murray, G.R. ; Guerra, Alexandre

  • Author_Institution
    Intel Corp., Folsom, CA, USA
  • Volume
    5
  • Issue
    4
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    329
  • Lastpage
    333
  • Abstract
    A receiver circuit with built-in electrical overstress protection for a graphics double data rate, version 5 (GDDR5) interface is proposed. The new circuit in a fully functional memory controller system is fabricated in a 45 nm CMOS process using only native thin-gate transistors. The receiver s functionality and performance are experimentally verified at 5.6 Gb/s with 20 ps set-up/hold and 54 mVpp voltage uncertainty with better than 10-12 bit error rate (BER).
  • Keywords
    CMOS integrated circuits; electrostatic discharge; error statistics; transistors; BER; CMOS; GDDR5; bit error rate; bit rate 5.6 Gbit/s; electrical overstress protection; graphics double data rate; memory controller system; receiver circuit; size 45 nm; thin-gate transistor;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2010.0212
  • Filename
    5963763