• DocumentCode
    129046
  • Title

    Efficient high-sigma yield analysis for high dimensional problems

  • Author

    Moning Zhang ; Zuochang Ye ; Yan Wang

  • Author_Institution
    Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    High-sigma analysis is important for estimating the probability of rare events. Traditional high-sigma analysis can only work for small-size (low-dimension) problems limiting to 10 ~ 20 random variables, mostly due to the difficulty of finding optimal boundary points. In this paper we propose an efficient method to deal with high-dimension problems. The proposed method is based on performing optimization in a series of low dimension parameter spaces. The final solution can be regarded as a greedy version of the global optimization. Experiments show that the proposed method can efficiently work with problems with > 100 independent variables.
  • Keywords
    integrated circuit yield; optimisation; probability; random functions; global optimization; high dimensional problems; high-sigma yield analysis; low-dimension problems; optimal boundary points; probability; random variables; rare events; Accuracy; Integrated circuit modeling; Monte Carlo methods; SPICE; SRAM cells; Standards; Vectors; High-sigma; high dimension; importance sampling; yield analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.120
  • Filename
    6800321