• DocumentCode
    1290591
  • Title

    In-circuit test techniques cut programming requirements

  • Author

    Apfelbaum, Larry ; Hotchkiss, Jeff

  • Author_Institution
    Teradyne Inc., Boston, USA
  • Volume
    25
  • Issue
    10
  • fYear
    1979
  • fDate
    10/1/1979 12:00:00 AM
  • Firstpage
    739
  • Lastpage
    740
  • Abstract
    Screening printed-circuit cards for assembly and component defects simplifies the entire testing programme.
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1979.0413
  • Filename
    5197570
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1290591