DocumentCode
1290857
Title
Experimental verification of pattern selection for noise characterization
Author
Van den Bosch, S. ; Martens, L.
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Belgium
Volume
48
Issue
1
fYear
2000
fDate
1/1/2000 12:00:00 AM
Firstpage
156
Lastpage
158
Abstract
A comparison is made between different pattern-selection procedures for noise characterization based on measurements of cold-FETs in a common-source configuration. The measurements were performed using an automated noise setup with one electro-mechanical tuner. The results confirm that a recently developed two-step pattern allows more accurate noise-parameter determination compared to existing practice. The significance of this paper lies in the confirmation of the simulation results presented earlier
Keywords
Schottky gate field effect transistors; microwave field effect transistors; semiconductor device models; semiconductor device noise; automated noise setup; cold-FETs; common-source configuration; electro-mechanical tuner; noise characterization; noise-parameter determination; pattern selection; simulation results; Frequency; Gallium arsenide; Impedance; Length measurement; Noise figure; Noise generators; Noise measurement; Performance evaluation; Stability; Tuners;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.817485
Filename
817485
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