• DocumentCode
    129089
  • Title

    Test and non-test cubes for diagnostic test generation based on merging of test cubes

  • Author

    Pomeranz, Irith

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Test generation by merging of test cubes supports test compaction and test data compression. This paper describes a new approach to the use of test cube merging for the generation of compact diagnostic test sets. For this the paper uses the new concept of non-test cubes. While a test cube for a fault fi0 detects the fault, a non-test cube for a fault fi1 prevents the fault from being detected. Merging a test cube for a fault fi0 and a non-test cube for a fault fi1 produces a diagnostic test cube that distinguishes the two faults. The paper describes a procedure for diagnostic test generation based on merging of test and non-test cubes. Experimental results demonstrate that compact diagnostic test sets are obtained.
  • Keywords
    automatic test pattern generation; fault diagnosis; compact diagnostic test set; diagnostic test generation; fault diagnosis; nontest cubes; Circuit faults; Educational institutions; Fault detection; Fault diagnosis; Merging; Test data compression; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.143
  • Filename
    6800344