• DocumentCode
    129104
  • Title

    Impact of steep-slope transistors on non-von Neumann architectures: CNN case study

  • Author

    Palit, Indranil ; Sedighi, Behnam ; Horvath, Andras ; Hu, Xiaobo Sharon ; Nahas, Joseph ; Niemier, Michael

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A Cellular Neural Network (CNN) is a highly-parallel, analog processor that can significantly outperform von Neumann architectures for certain classes of problems. Here, we show how emerging, beyond-CMOS devices could help to further enhance the capabilities of CNNs, particularly for solving problems with non-binary outputs. We show how CNNs based on devices such as graphene transistors - with multiple steep current growth regions separated by negative differential resistance (NDR) in their I-V characteristics - could be used to recognize multiple patterns simultaneously. (This would require multiple steps given a conventional, binary CNN.) Also, we demonstrate how tunneling field effect transistors (TFETs) can be used to form circuits capable of performing similar tasks. With this approach, more “exotic” device I-V characteristics are not required - which should be an asset when considering issues such as cell-to-cell mismatch, etc. As a case study, we present a CNN-cell design that employs TFET-based circuitry to realize ternary outputs. We then illustrate how this hardware could be employed to efficiently solve a tactile sensing problem. The total number of computation steps as well as the required hardware could be reduced significantly when compared to an approach based on a conventional CNN.
  • Keywords
    CMOS integrated circuits; cellular neural nets; electronic engineering computing; field effect transistors; graphene; negative resistance; tunnel transistors; CMOS devices; I-V characteristics; NDR; TFETs; analog processor; binary CNN; cellular neural network; exotic device; graphene transistors; multiple steep current growth regions; negative differential resistance; nonbinary outputs; nonvon Neumann architectures; steep-slope transistors; tactile sensing problem; ternary outputs; tunneling field effect transistors; Computer architecture; Graphene; Hardware; Performance evaluation; Resistance; Sensors; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.150
  • Filename
    6800351