DocumentCode :
1291378
Title :
A Theoretically Rigorous Full-Wave Finite-Element-Based Solution of Maxwell´s Equations From dc to High Frequencies
Author :
Zhu, Jianfang ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
33
Issue :
4
fYear :
2010
Firstpage :
1043
Lastpage :
1050
Abstract :
It has been observed that finite element based solutions of full-wave Maxwell´s equations break down at low frequencies. In this paper, we present a theoretically rigorous method to fundamentally eliminate the low-frequency breakdown problem. The key idea of this method is that the original frequency-dependent deterministic problem can be rigorously solved from a generalized eigenvalue problem that is frequency independent. In addition, we found that the zero eigenvalues of the generalized eigenvalue problem cannot be obtained as zeros because of finite machine precision. We hence correct the inexact zero eigenvalues to be exact zeros. The validity and accuracy of the proposed method have been demonstrated by the analysis of both lossless and lossy problems having on-chip circuit dimensions from dc to high frequencies. The proposed method is applicable to any frequency. Hence it constitutes a universal solution of Maxwell´s equations in a full electromagnetic spectrum. The proposed method can be used to not only fundamentally eliminate the low-frequency breakdown problem, but also benchmark the accuracy of existing electromagnetic solvers at low frequencies including static solvers. Such a benchmark does not exist yet because full-wave solvers break down while static solvers involve theoretical approximations.
Keywords :
Maxwell equations; finite element analysis; electromagnetic solver; electromagnetic spectrum; finite machine precision; frequency-dependent deterministic problem; full wave solver; full-wave Maxwell equations; generalized eigenvalue problem; inexact zero eigenvalue; lossless problem; lossy problem; low-frequency breakdown problem; on-chip circuit dimension; rigorous full-wave finite element-based solution; static solver; Approximation methods; Circuits; Eigenvalues and eigenfunctions; Electric breakdown; Electromagnetic spectrum; Electromagnetics; Finite element methods; Frequency; Helium; Maxwell equations; Switches; System-on-a-chip; Very large scale integration; Electromagnetic analysis; finite element methods; full-wave analysis; low-frequency breakdown; very large scale integrated (VLSI) circuits;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2010.2057428
Filename :
5545471
Link To Document :
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