• DocumentCode
    1292905
  • Title

    A quasi-static modification of TLM at knife edge and 90° wedge singularities

  • Author

    Cascio, Lucia ; Tardioli, Giampaolo ; Rozzi, Tullio ; Hoefer, Wolfgang J R

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • Volume
    44
  • Issue
    12
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2519
  • Lastpage
    2524
  • Abstract
    A common drawback of numerical techniques such as transmission line method (TLM) and finite-difference time-domain method (FDTD) resides in the difficulty to accurately describe the electromagnetic field in structures with singularities. In this paper a local modification of the two-dimensional (2-D) TLM algorithm for the nodes surrounding a knife edge and a 90° wedge is proposed. A quasi-static approximation of the field is used to derive an equivalent circuit of the edge. The proposed theory is then extended to the characterization of infinitely thin septa, the vertex of which is located anywhere between the nodes of the TLM mesh. The proposed corner correction is compared with the uncorrected TLM results and with data available in the literature, revealing a marked enhancement in the accuracy and convergence of the results
  • Keywords
    electromagnetic fields; equivalent circuits; finite difference time-domain analysis; transmission line matrix methods; waveguide discontinuities; TLM; corner correction; electromagnetic field; equivalent circuit; finite-difference time-domain method; infinitely thin septa; knife edge; local modification; quasi-static approximation; quasi-static modification; uncorrected TLM results; wedge singularities; Convergence; Electromagnetic analysis; Electromagnetic fields; Equivalent circuits; Finite difference methods; Frequency domain analysis; Helium; Time domain analysis; Transmission line theory; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.554591
  • Filename
    554591