DocumentCode :
1293296
Title :
A scannable pulse-to-static conversion register array for self-timed circuits
Author :
Hwang, Wei ; Joshi, Rajiv V. ; Gristede, George D.
Author_Institution :
Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
35
Issue :
1
fYear :
2000
Firstpage :
125
Lastpage :
128
Abstract :
This paper describes the design and hardware results of a scannable pulse-to-static conversion register array for self-timed circuits. The circuits include a self-timed control circuit and a 64-bit register array, both designed utilizing self-resetting CMOS (SRCMOS) circuit techniques. The self-timed feature of the control block allows it to require only one system clock input. The evaluation, reset, and write-enable controls are all generated within the control macro. The register array is a level-sensitive scan design, which is compatible and complies with SRCMOS test modes. This type of register array can facilitate the synchronous/asynchronous interfaces, pipelined operation, power management, and testing of advanced digital systems employing a mixture of static and dynamic circuits to achieve low power and high performance.
Keywords :
CMOS logic circuits; logic arrays; timing circuits; 64 bit; dynamic logic circuit; level-sensitive scan design; pipelined operation; scannable pulse-to-static conversion register array; self-resetting CMOS circuit; self-timed circuit; CMOS technology; Circuit testing; Clocks; Control systems; Energy management; Hardware; Power system management; Pulse circuits; Registers; System testing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.818930
Filename :
818930
Link To Document :
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