• DocumentCode
    1296462
  • Title

    Quantized Hall resistance measurement at the NML

  • Author

    Ricketts, Brian W. ; Cage, Marvin E.

  • Author_Institution
    Commonwealth Scientific and Industrial Research Organization, Division of Applied Physics, National Measurement Laboratory, Sydney, Australia 2070
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    An automatic measurement system has been used to determine the values of quantized Hall resistances RH in terms of the National Measurement Laboratory (NML) realization of the International System (SI) ohm. The quantized Hall resistances of two GaAs-AlGaAs heterostructures were measured. The n = 2 step of one heterostructure and the n = 4 step of the other were measured over a seven-month period. A weighted mean of these determinations gave a value for the quantity RH(n = 1) of 0.383 ppm (0.078 ppm one-standard-deviation (1σ) uncertainty) above the nominal 25 812.80 Ω in SI units.
  • Keywords
    Current measurement; Electrical resistance measurement; Resistance; Resistors; Silicon; Temperature measurement; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312678
  • Filename
    6312678
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1296462