• DocumentCode
    1297563
  • Title

    A three-site comparison of fade-duration measurements

  • Author

    Helmken, Henry ; Henning, Rudolf E. ; Feil, Julie ; Ippolito, Louis J., Jr. ; Mayer, Charles E.

  • Author_Institution
    Florida Atlantic Univ., Boca Raton, FL, USA
  • Volume
    85
  • Issue
    6
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    917
  • Lastpage
    925
  • Abstract
    Important elements in the design of Ka-band communication systems are the duration of fade and nonfade events at a particular fade depth. The choice of modulation and forward error correcting codes will depend on both the fading time dynamics and annual fade occurrence statistics. This paper examines the fade duration measured at locations in three of the Advanced Communications Technology Satellite (ACTS) propagation experimental regions, namely, Florida (rain zone N of the radiocommunications sector of the International Telecommunications Union [ITU-R] model), New Mexico State University (ITU-R rain zone M), and Alaska (ITU-R rain zone C). Within each region, measures of the underlying uniformity are described and an interregional comparison examines the ability to scale the local results
  • Keywords
    fading; microwave propagation; millimetre wave propagation; probability; rain; satellite communication; satellite links; statistical analysis; tropospheric electromagnetic wave propagation; ACTS propagation experimental regions; Advanced Communications Technology Satellite; Alaska; Florida; ITU-R model; Ka-band communication systems; New Mexico State University; annual fade occurrence statistics; fade-duration measurements; fading time dynamics; interregional comparison; rain zone C; rain zone M; rain zone N; three-site comparison; Artificial satellites; Attenuation; Communications technology; Error analysis; Extraterrestrial measurements; Fading; Modulation coding; Rain; Satellite broadcasting; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.598414
  • Filename
    598414