• DocumentCode
    1297969
  • Title

    Fast Similarity Search for Learned Metrics

  • Author

    Kulis, Brian ; Jain, Prateek ; Grauman, Kristen

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Univ. of California at Berkeley, Berkeley, CA, USA
  • Volume
    31
  • Issue
    12
  • fYear
    2009
  • Firstpage
    2143
  • Lastpage
    2157
  • Abstract
    We introduce a method that enables scalable similarity search for learned metrics. Given pairwise similarity and dissimilarity constraints between some examples, we learn a Mahalanobis distance function that captures the examples´ underlying relationships well. To allow sublinear time similarity search under the learned metric, we show how to encode the learned metric parameterization into randomized locality-sensitive hash functions. We further formulate an indirect solution that enables metric learning and hashing for vector spaces whose high dimensionality makes it infeasible to learn an explicit transformation over the feature dimensions. We demonstrate the approach applied to a variety of image data sets, as well as a systems data set. The learned metrics improve accuracy relative to commonly used metric baselines, while our hashing construction enables efficient indexing with learned distances and very large databases.
  • Keywords
    cryptography; image retrieval; indexing; learning (artificial intelligence); very large databases; Mahalanobis distance function; fast similarity search; hashing construction; image data set; learned distances; learned metric parameterization; metric baselines; pairwise dissimilarity constraints; pairwise similarity constraints; randomized locality-sensitive hash function; scalable similarity search; systems data set; very large databases; LogDet divergence; Metric learning; image search.; kernel learning; locality-sensitive hashing; similarity search; Algorithms; Artificial Intelligence; Databases, Factual; Humans; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Posture;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2009.151
  • Filename
    5204087