DocumentCode
1297969
Title
Fast Similarity Search for Learned Metrics
Author
Kulis, Brian ; Jain, Prateek ; Grauman, Kristen
Author_Institution
Electr. Eng. & Comput. Sci. Dept., Univ. of California at Berkeley, Berkeley, CA, USA
Volume
31
Issue
12
fYear
2009
Firstpage
2143
Lastpage
2157
Abstract
We introduce a method that enables scalable similarity search for learned metrics. Given pairwise similarity and dissimilarity constraints between some examples, we learn a Mahalanobis distance function that captures the examples´ underlying relationships well. To allow sublinear time similarity search under the learned metric, we show how to encode the learned metric parameterization into randomized locality-sensitive hash functions. We further formulate an indirect solution that enables metric learning and hashing for vector spaces whose high dimensionality makes it infeasible to learn an explicit transformation over the feature dimensions. We demonstrate the approach applied to a variety of image data sets, as well as a systems data set. The learned metrics improve accuracy relative to commonly used metric baselines, while our hashing construction enables efficient indexing with learned distances and very large databases.
Keywords
cryptography; image retrieval; indexing; learning (artificial intelligence); very large databases; Mahalanobis distance function; fast similarity search; hashing construction; image data set; learned distances; learned metric parameterization; metric baselines; pairwise dissimilarity constraints; pairwise similarity constraints; randomized locality-sensitive hash function; scalable similarity search; systems data set; very large databases; LogDet divergence; Metric learning; image search.; kernel learning; locality-sensitive hashing; similarity search; Algorithms; Artificial Intelligence; Databases, Factual; Humans; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Posture;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2009.151
Filename
5204087
Link To Document