Title :
Optimization of Medipix-2 Threshold Masks for Spectroscopic X-Ray Imaging
Author :
Procz, Simon ; Lübke, Jordis ; Zwerger, Andreas ; Mix, Michael ; Fiederle, Michael
Author_Institution :
Freiburger Materialforschungszentrum (FMF), Freiburg, Germany
Abstract :
Spectroscopic X-ray imaging enhances image contrast and provides advanced object information due to energy resolution. The Medipix-2 chip is a photon counting semiconductor detector and features two energy thresholds for energy selective imaging. The aim of this study is to present the development of optimized threshold adjustment masks with small energy windows of about 3 keV width using a monochromatic X-ray source for equalization and to demonstrate the benefits of spectroscopic X-ray imaging using an integrated circuit as object.
Keywords :
X-ray detection; X-ray imaging; X-ray masks; integrated circuits; optimisation; photon counting; semiconductor counters; Medipix-2 threshold masks; advanced object information; energy resolution; energy selective imaging; integrated circuit; monochromatic X-ray source; optimization; photon counting semiconductor detector; spectroscopic X-ray imaging; Biomedical imaging; Computed tomography; Energy resolution; Image resolution; Medical diagnosis; Optical imaging; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging; Energy resolution; X-ray imaging; semiconductor detectors; threshold;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2025175
