DocumentCode
1300149
Title
Measurements of thermal effects in fibers doped with cobalt and vanadium
Author
Davis, Monica K. ; Digonnet, Michel J F
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume
18
Issue
2
fYear
2000
Firstpage
161
Lastpage
165
Abstract
Thermal index changes due to nonradiative relaxation in optically pumped Co/sup 2+/-doped and V/sup n+/ doped fibers are studied experimentally by an interferometric method. In both dopants these effects are shown to be very strong and to mask any residual resonantly enhanced nonlinearity. The measured magnitude and time constants of thermal effects are well explained by a new theoretical model, which confirms its validity and usefulness. These measurements also demonstrate a new and simple method to differentiate between nonlinear and thermal phase shifts in doped fibers based on the dependence of the phase change on the pump pulsewidth. This study provides new information on the spectroscopy of these two dopants, including the percentage of absorbed power they transform into heat (/spl sim/38% for Co/sup 2+/ and 56% for V/sup n+/), and the likely presence of clusters in Co/sup 2+/-doped silica even at very low concentrations (8 wt ppm CoO).
Keywords
cobalt; doping profiles; light interferometry; optical fibre testing; thermo-optical effects; vanadium; Co/sup 2+/-doped fibers; Co/sup 2+/-doped silica; V/sup n+/ doped fibers; absorbed power; clusters; interferometric method; nonlinear phase shifts; nonradiative relaxation; optical fibre measurements; optically pumped; pump pulsewidth; residual resonantly enhanced nonlinearity; spectroscopy; theoretical model; thermal effects; thermal index changes; thermal phase shifts; time constants; very low concentrations; Cobalt; Fiber nonlinear optics; Optical interferometry; Optical pumping; Phase measurement; Pulse measurements; Resonance; Semiconductor process modeling; Space vector pulse width modulation; Time measurement;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.822788
Filename
822788
Link To Document