• DocumentCode
    1301182
  • Title

    Antijam capability analysis of RS-coded slow frequency-hopped systems

  • Author

    Su, Yu.T. ; Jeng, Li-Der

  • Author_Institution
    Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    48
  • Issue
    2
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    270
  • Lastpage
    281
  • Abstract
    The application of Reed-Solomon codes in slow frequency-hopped systems has been extensively studied. Earlier investigations assumed an infinite interleaving length and considered partial-band noise jammers only. This paper extends previous efforts by analyzing the effect of finite interleaving length and the impact of band multitone jammers. We also explain why two-threshold (2T) erasure-insertion methods (EIM) are needed and examine their performance. Numerical results are presented to compare the effectiveness of the EIM and jammer types and to study the relationships among the hop rate, the interleaver size, and the code rate. The use of 2T-EIM necessitates the estimation of several additional channel and signal parameters. Simple and effective estimation algorithms are provided as well
  • Keywords
    Reed-Solomon codes; error statistics; frequency hop communication; frequency shift keying; interleaved codes; jamming; parameter estimation; Bayesian methods; MFSK; RS-coded slow frequency-hopped systems; Reed-Solomon codes; antijam capability analysis; band multitone jammers; channel parameter estimation; code rate; codeword error probability; conditional probabilities; estimation algorithms; finite interleaving length; hop rate; infinite interleaving length; interleaver size; partial-band noise jammers; signal parameter estimation; two-threshold erasure-insertion methods; Bayesian methods; Concatenated codes; Decoding; Forward error correction; Frequency diversity; Frequency shift keying; Interleaved codes; Jamming; Protection; Testing;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/26.823560
  • Filename
    823560