• DocumentCode
    1301413
  • Title

    Long-term attraction in higher order neural networks

  • Author

    Burshtein, David

  • Author_Institution
    Dept. of Electr. Eng., Tel Aviv Univ., Israel
  • Volume
    9
  • Issue
    1
  • fYear
    1998
  • fDate
    1/1/1998 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    50
  • Abstract
    Recent results on the memory storage capacity of higher order neural networks indicate a significant improvement compared to the limited capacity of the Hopfield model. However, such results have so far been obtained under the restriction that only a single iteration is allowed to converge. This paper presents a indirect convergence (long-term attraction) analysis of higher order neural networks. Our main result is that for any κd<d!2d-1/(2d)!, and 0⩽ρ<1/2, a Hebbian higher order neural network of order d with n neurons can store a random set of κdnd/log n fundamental memories such that almost all memories have an attraction radius of size ρn. If κd<d!2d-1/((2d)!(d+1)), then all memories possess this property simultaneously. It indicates that the lower bounds on the long-term attraction capacities are larger than the corresponding direct convergence capacities by a factor of 1/(1-2ρ) 2d. In addition we upper bound the convergence rate (number of iterations required to converge). This bound is asymptotically independent of n. Similar results are obtained for zero diagonal higher order neural networks
  • Keywords
    Hopfield neural nets; associative processing; content-addressable storage; convergence; iterative methods; Hebbian neural network; Hopfield associative memory; convergence rate; higher order neural networks; indirect convergence; iterative method; long-term attraction; memory capacity; upper bound; Associative memory; Convergence; Error correction; Hebbian theory; Hopfield neural networks; Intelligent networks; Learning systems; Neural networks; Neurons; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/72.655028
  • Filename
    655028