DocumentCode :
1301741
Title :
Experimental validation of surface scattering and emission models
Author :
Macelloni, Giovanni ; Nesti, Giuseppe ; Pampaloni, Paolo ; Sigismondi, Simone ; Tarchi, Dario ; Lolli, Simone
Author_Institution :
Ist. di Ricerca sulle Onde Elettromagnetiche, CNR, Firenze, Italy
Volume :
38
Issue :
1
fYear :
2000
fDate :
1/1/2000 12:00:00 AM
Firstpage :
459
Lastpage :
469
Abstract :
Multifrequency polarimetric scattering and emissivity measurements have been carried out on three experimental dielectric models, characterized by random surfaces with different statistics. The results of the measurements have been compared with simulations obtained through physical models based on the classical approximations of physical optics (PO), geometrical optics (GO), small perturbation (SP), and integral equation model (IEM). The comparison of experimental data with theory has shown that, even when the parameters of the observed surface are well determined and known, some discrepancy may exist between models and measurements. Except for a few cases, this discrepancy is quite small and may be insignificant for many practical applications. The IEM has been proven to have a wider range of applicability with respect to other tested approximations
Keywords :
backscatter; geophysical techniques; hydrological techniques; radar cross-sections; radar theory; radiometry; remote sensing; remote sensing by radar; soil; synthetic aperture radar; terrain mapping; backscatter; dielectric model; emissivity; experimental validation; geometrical optics; geophysical measurement technique; hydrology; integral equation model; land surface; microwave emission model; microwave radiometry; multifrequency polarimetric scattering; physical optics; radar polarimetry; radar remote sensing; radar scattering; random surface; small perturbation; soil moisture; surface scattering; terrain mapping; Dielectric measurements; Electromagnetic measurements; Electromagnetic scattering; Optical scattering; Optical surface waves; Rough surfaces; Scattering parameters; Solid modeling; Statistics; Surface roughness;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/36.823941
Filename :
823941
Link To Document :
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