• DocumentCode
    130183
  • Title

    Prognostics and health management based refurbishment for life extension of electronic systems

  • Author

    Varde, Prabhakar V. ; Jing Tian ; Pecht, Michael G.

  • Author_Institution
    Reactor Group, Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2014
  • fDate
    28-30 July 2014
  • Firstpage
    1260
  • Lastpage
    1267
  • Abstract
    To provide an early warning of failure for cost effective maintenance to extend the life of electronic systems, there is a growing interest to perform prognostics and health management. This paper provides a review of various prognostics and health management approaches that involve sensing, parameter interpretation, anomaly detection, weak components diagnosis, system health assessment, and remaining useful life prediction. Using prognostics and health management, a method is developed for electronic system life extension based on refurbishment in this study. Research areas of prognostics and health management for electronic system life extension are suggested, and recommendations are provided for designers and manufacturers who are interested in extending the life of electronic systems via refurbishment. Following these recommendations, electronic system life cycle cost could be minimized via refurbishment.
  • Keywords
    circuit reliability; life cycle costing; maintenance engineering; product life cycle management; anomaly detection; electronic system health management; electronic system life cycle cost; electronic system life extension; electronic system prognostics; electronic system refurbishment; failure early warning; parameter interpretation; weak components diagnosis; Consumer electronics; Maintenance engineering; Monitoring; Prognostics and health management; Reliability; Sensor systems; electronic system; life extension; prognostics and health management; refurbish; remanufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Automation (ICIA), 2014 IEEE International Conference on
  • Conference_Location
    Hailar
  • Type

    conf

  • DOI
    10.1109/ICInfA.2014.6932842
  • Filename
    6932842