Title :
Efficient Excess Intensity Noise Suppression of 100-GHz Spectrum-Sliced WDM-PON With a Narrow-Bandwidth Seed Light Source
Author :
Lee, Han Hyub ; Cho, Seung-Hyun ; Lee, Sang Soo
Author_Institution :
Opt. Internet Res. Dept., Electron. & Telecommun. Res. Inst. (ETRI), Daejeon, South Korea
Abstract :
In spectrum-sliced wavelength-division-multiplexing (WDM) passive optical networks (PONs) based on injection-seeded reflective semiconductor optical amplifiers, the inevitable spectral filtering by multiplexer/demultiplexer leads to an increase in excess intensity noise (EIN). The increased EIN degrades the signal-to-noise ratio of the modulated optical signal. To reduce the EIN, we utilized flat-top passband arrayed waveguide gratings and a narrow-bandwidth seed light source in a WDM-PON. The feasibility of a 32 1.25-Gb/s WDM-PON with 100-GHz channel spacing over a 20-km single-mode fiber was successfully demonstrated with a negligible power penalty.
Keywords :
arrayed waveguide gratings; channel spacing; interference suppression; optical fibre networks; optical filters; optical modulation; semiconductor optical amplifiers; wavelength division multiplexing; bit rate 1.25 Gbit/s; bit rate 40 Gbit/s; channel spacing; distance 20 km; excess intensity noise suppression; flat-top passband arrayed waveguide gratings; frequency 100 GHz; injection-seeded reflective semiconductor optical amplifiers; modulated optical signal; multiplexer/demultiplexer; narrow-bandwidth seed light source; passive optical networks; signal-to-noise ratio; single-mode fiber; spectral filtering; spectrum-sliced WDM-PON; wavelength division multiplexing; Filtering; Optical distortion; Optical filters; Optical reflection; Passive optical networks; Semiconductor optical amplifiers; Wavelength division multiplexing; Excess intensity noise (EIN); passive optical access network; reflective semiconductor optical amplifier (R-SOA); seed light; spectrum slicing; wavelength-division multiplexing (WDM);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2010.2069088