Title :
Improving robustness of vector fitting to outliers in data
Author :
Deschrijver, Dirk ; Knockaert, Luc ; Dhaene, Tom
Author_Institution :
Dept. of Inf. Technol. (INTEC), Ghent Univ., Ghent, Belgium
Abstract :
A new algorithm is introduced for broadband macromodelling of passive electronic components from frequency response data. It modifies the vector fitting algorithm in such a way that the L1 norm of the approximation error is minimised, rather than the L2 norm. It is shown that this approach is more robust towards outliers in the data.
Keywords :
S-parameters; curve fitting; frequency response; integrated circuit interconnections; frequency response data; passive electronic components; robustness; vector fitting;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.1364
