Title :
Linear feedback shift register design using cyclic codes
Author :
Wang, Laung-Terng ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
fDate :
10/1/1988 12:00:00 AM
Abstract :
A design technique is given for linear-feedback shift registers (LFSR) that generate test patterns for pseudoexhaustive testing of networks with restricted output dependency. This technique is based on cyclic code theory. Examples indicate that LFSRs based on cyclic codes are easier to implement and have lower hardware overhead than LFSRs that use other linear codes
Keywords :
codes; feedback; shift registers; cyclic codes; design technique; linear-feedback shift registers; pseudoexhaustive testing; test patterns; Automatic testing; Built-in self-test; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Hardware; Linear code; Linear feedback shift registers; Test pattern generators;
Journal_Title :
Computers, IEEE Transactions on
