• DocumentCode
    130574
  • Title

    New generation of isolated electron-injection imagers

  • Author

    Fathipour, Vala ; Jang, Sung J. ; Mohseni, Hooman

  • Author_Institution
    Dept. of EECS, Northwestern Univ., Evanston, IL, USA
  • fYear
    2014
  • fDate
    7-11 July 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper describes a novel electron-injection based short-wave infrared imager. The first generation of electron-injection imager achieved two orders of magnitude better signal to noise ratio compared with a commercial high-end SWIR camera. In the second generation, detectors are isolated and achieve extremely low dark current, record low noise levels and fast rise times while maintaining the very large internal amplification. Furthermore, electron-injection imager shows superior noise performance compared with imagers made with the state-of-the-art InGaAs PIN and MCT eAPDs.
  • Keywords
    avalanche photodiodes; image sensors; infrared detectors; infrared imaging; p-i-n photodiodes; InGaAs PIN; MCT eAPD; commercial high-end SWIR camera; dark current; detectors; electron-injection based short-wave infrared imager; internal amplification; noise levels; noise performance; orders of magnitude; rise times; signal to noise ratio; Cameras; Dark current; Detectors; Indium gallium arsenide; Noise; Photonics; Infrared detectors; Infrared image sensors; Infrared imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Optics (WIO), 2014 13th Workshop on
  • Conference_Location
    Neuchatel
  • Type

    conf

  • DOI
    10.1109/WIO.2014.6933282
  • Filename
    6933282