DocumentCode
130574
Title
New generation of isolated electron-injection imagers
Author
Fathipour, Vala ; Jang, Sung J. ; Mohseni, Hooman
Author_Institution
Dept. of EECS, Northwestern Univ., Evanston, IL, USA
fYear
2014
fDate
7-11 July 2014
Firstpage
1
Lastpage
3
Abstract
This paper describes a novel electron-injection based short-wave infrared imager. The first generation of electron-injection imager achieved two orders of magnitude better signal to noise ratio compared with a commercial high-end SWIR camera. In the second generation, detectors are isolated and achieve extremely low dark current, record low noise levels and fast rise times while maintaining the very large internal amplification. Furthermore, electron-injection imager shows superior noise performance compared with imagers made with the state-of-the-art InGaAs PIN and MCT eAPDs.
Keywords
avalanche photodiodes; image sensors; infrared detectors; infrared imaging; p-i-n photodiodes; InGaAs PIN; MCT eAPD; commercial high-end SWIR camera; dark current; detectors; electron-injection based short-wave infrared imager; internal amplification; noise levels; noise performance; orders of magnitude; rise times; signal to noise ratio; Cameras; Dark current; Detectors; Indium gallium arsenide; Noise; Photonics; Infrared detectors; Infrared image sensors; Infrared imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Optics (WIO), 2014 13th Workshop on
Conference_Location
Neuchatel
Type
conf
DOI
10.1109/WIO.2014.6933282
Filename
6933282
Link To Document