Title :
Analyzing R&D knowledge flows in the flat world
Author :
Whelan, Eoin ; Donnellan, B. ; Golden, Willie
Abstract :
This publication contains reprint articles for which IEEE does not hold copyright. Full text is not available on IEEE Xplore for these articles.
Journal_Title :
Engineering Management Review, IEEE
DOI :
10.1109/EMR.2010.5559145
