Title :
Degradation of precision reference devices in space environments
Author :
Rax, B.G. ; Lee, C.I. ; Johnston, A.H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
The degradation of precision reference devices is investigated to determine the relative importance of ionization and displacement damage. The results are compared with theoretical calculations of a basic bandgap reference circuit. Several of the device types were degraded severely at 20 krad(Si), with about the same degradation as that predicted for the basic bandgap reference circuit. One very high precision device with an internal heater performed far better than any of the other devices in the study
Keywords :
bipolar analogue integrated circuits; circuit stability; gamma-ray effects; proton effects; reference circuits; space vehicle electronics; 20 krad; bandgap reference circuit; bipolar linear ICs; displacement damage; internal heater; ionization damage; precision reference device degradation; space environment; Circuits; Degradation; Ionization; Laboratories; Propulsion; Protons; Space technology; Stability; Temperature sensors; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
