DocumentCode :
1308398
Title :
Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity
Author :
Noskov, Yury N.
Author_Institution :
Inst. of Res. & Prod., Ferrite Domen Co., St. Petersburg, Russia
Volume :
48
Issue :
3
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
329
Lastpage :
333
Abstract :
In this paper, a method for measuring properties of ceramic materials with relative dielectric constant value of 20-150 is proposed. It permits us to eliminate the operating TM01δ-mode degeneration due to its frequency coincidence with other modes, including ones of higher order. Both that fact and the possibility of precise calculation of an unloaded quality factor for a cavity permit one to execute the accurate measurements of loss tangent values as low as (1÷0, 5)×10-4, the error of dielectric constant measurement being equal to or less than 1%. The feasibility of precise measurement of the loaded Q-factor of a cavity by the readings of micrometric probe makes the use of frequency meters unnecessary
Keywords :
Q-factor; cavity resonators; ceramics; dielectric loss measurement; microwave measurement; permittivity measurement; TM01δ-mode degeneration; ceramic materials; cutoff waveguide cavity; dielectric constant measurement; loss tangent values; micrometric probe; relative dielectric constant; unloaded quality factor; Ceramics; Damping; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; High-K gate dielectrics; Loss measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.826830
Filename :
826830
Link To Document :
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