Simulation of in-flight ESD anomalies triggered by photoemission, micrometeoroid impact and pressure pulse

Author

Levy, L. ; Mandeville, J.C. ; Siguler, J.M. ; Reulet, R. ; Sarrail, D. ; Catani, J.P. ; Gerlach, L.

Author_Institution

CERT-ONERA, Toulouse, France

Volume

44

Issue

6

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

2201

Lastpage

2208

Abstract

Energetic electrons encountered in space produce electrostatic discharges (ESD) resulting from potential growth of dielectrics up to the breakdown threshold. Materials with very high threshold are often considered as rather safe for ESD. In-flight observed anomalies and experimental results presented in this paper show that discharges can be obtained for potential lower than the threshold by triggering events such as photon illumination, micrometeoroid impacts or pressure and plasma pulse

Keywords

aerospace simulation; electrostatic discharge; integrated circuit reliability; meteoroids; photoemission; reliability; space vehicle electronics; spacecraft charging; breakdown threshold; in-flight ESD anomalies; micrometeoroid impact; photoemission; plasma pulse; pressure pulse; space energetic electrons; space vehicle electronics; Dielectrics; Electron emission; Electrostatic discharge; Fault location; Lighting; Photoelectricity; Plasma materials processing; Satellites; Surface charging; Surface discharges;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.659036

Filename

659036