DocumentCode
1313626
Title
Accurate and efficient circuit simulation with lumped-element FDTD technique
Author
Ciampolini, Paolo ; Mezzanotte, Paolo ; Roselli, Luca ; Sorrentino, Roberto
Author_Institution
Istituto di Elettronica, Perugia Univ., Italy
Volume
44
Issue
12
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
2207
Lastpage
2215
Abstract
A three-dimensional (3-D) implementation of the lumped-element finite-difference time-domain (FDTD) algorithm has been carried out. To accomplish proper description of device dynamic responses, the code incorporates accurate models of lumped bipolar devices, including nonlinear capacitances associated with pn and Schottky junctions. The nonlinear system arising from discretized lumped-element equations is solved by means of an iterative Newton-Raphson algorithm, the convergence properties of which are sensitive to the value of the simulation time step. The computational efficiency of the algorithm (as well as its robustness) has significantly been enhanced by introducing an adaptive time-step algorithm, which dynamically adjusts the time-step itself to ensure convergence during the simulation. Several simulation examples are compared with conventional analysis techniques and demonstrate the algorithm reliability as well as its increased efficiency
Keywords
Newton-Raphson method; circuit CAD; circuit analysis computing; convergence of numerical methods; finite difference time-domain analysis; microwave circuits; Schottky junctions; adaptive time-step algorithm; algorithm reliability; circuit simulation; computational efficiency; convergence properties; device dynamic responses; discretized lumped-element equations; iterative Newton-Raphson algorithm; lumped bipolar devices; lumped-element FDTD technique; nonlinear capacitances; Capacitance; Circuit simulation; Computational modeling; Convergence; Finite difference methods; Iterative algorithms; Nonlinear dynamical systems; Nonlinear equations; Nonlinear systems; Time domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.556448
Filename
556448
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