• DocumentCode
    13168
  • Title

    Behavioral Modeling of a CMOS–MEMS Nonlinear Parametric Resonator

  • Author

    Congzhong Guo ; Fedder, Gary K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    22
  • Issue
    6
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    1447
  • Lastpage
    1457
  • Abstract
    Predictive design of nonlinear microelectromechanical systems featuring parametric resonance provides motivation to refine mixed MEMS/analog behavioral composable modeling and simulation methodologies. Toward this end, a schematic of a canonical parametric resonator testbed is built with primitive beam, plate, and gap models from a MEMS Verilog-AMS library along with a macro model of a non-interdigitated comb with electrostatic spring coefficients extracted from finite element analysis. A CMOS-MEMS parametric resonator for validation experiments exploits the well known non-interdigitated finger design to create a voltage-controlled spring constant as the parametric stimulus. Behavioral modeling and the analytic perturbation solutions are validated by optical vibration measurements matching to 0.2% and 2.1%, respectively.
  • Keywords
    CMOS integrated circuits; hardware description languages; micromechanical resonators; perturbation techniques; springs (mechanical); vibration measurement; voltage control; CMOS-MEMS nonlinear parametric resonator; MEMS Verilog-AMS library; analytic perturbation solutions; canonical parametric resonator testbed; electrostatic spring; finite element analysis; gap models; mixed MEMS-analog behavioral composable modeling; noninterdigitated comb; noninterdigitated finger design; nonlinear microelectromechanical systems; optical vibration measurement matching; parametric resonance; plate models; predictive design; simulation methodologies; voltage-controlled spring constant; CMOS–MEMS; Mathieu equation; electrostatic devices; microresonators; nonlinear oscillators; parametric oscillators;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2013.2262589
  • Filename
    6547991