Title :
Reliability of Nondeteriorating Devices
Author_Institution :
``Institut fur Angewandte System-technik und Reaktorphysik´´´´ in Karlsruhe on safety and reliability problems.
Abstract :
A general theory has been developed for calculating the reliability of a device which does not deteriorate with time and which is exposed to a stochastic load. Two important cases of stochastic loads have been considered: (1) statistically independent random pulses, and (2) a sequence of random pulses, each one separated from the next one by a random period of time during which no load is applied to the device. Numerical examples are included.
Keywords :
Acquired immune deficiency syndrome; Circuits; Degradation; Reliability engineering; Reliability theory; Space vector pulse width modulation; Stochastic processes; Stress; Temperature; Voltage;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215248
