Title :
Reliability Analysis of Logic Circuits
Author :
DesMarais, P. ; Krieger, Michael
Author_Institution :
Dept. of Electrical Engineering/University of Ottawa/Ottawa, Ontario K1N 6N5 CANADA
fDate :
4/1/1975 12:00:00 AM
Abstract :
An efficient algorithm is presented for computing the reliability matrix of a logic network whose components are characterized by a known probability of malfunctioning. Using the concept of path sensitizing, a graphical representation of error propagation is derived. Through the computation of Boolean path functions, the information provided by these graphs is put into a malfunction table from which the matrix entries are directly computed. The method not only offers computational efficiency but also provides further physical insight into the reliability problem.
Keywords :
Boolean algebra; Circuit analysis; Circuit analysis computing; Computational efficiency; Computer networks; Fault tolerance; Intersymbol interference; Logic circuits; Sequential circuits; Stochastic processes;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1975.5215328