Title :
30 dB sampled gratings in germanosilicate planar waveguides
Author :
Ibsen, M. ; Hubner, J. ; Kromann, R. ; Andersen, L.-U.A. ; Kristensen, M.
Author_Institution :
Mikroelektronik Centret, Tech. Univ., Lyngby
fDate :
11/21/1996 12:00:00 AM
Abstract :
The authors demonstrate sampled gratings in germanosilicate planar waveguides with multiple, equally spaced reflection peaks of high visibility. Sampled gratings with a reflection-peak separation of 2.72 nm (334 GHz) and a reflectivity of 99.9% are UV induced in buried waveguides by using a single amplitude modulated UV-exposure through a phasemask
Keywords :
diffraction gratings; germanium; light reflection; optical communication equipment; optical planar waveguides; silicon compounds; wavelength division multiplexing; 2.72 nm; SiO2:Ge; amplitude modulated UV-exposure; buried waveguides; equally spaced reflection peaks; optical WDM transmission; phasemask; planar waveguides; reflection-peak separation; reflectivity; sampled gratings;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961522
