Title :
Monolithic InP-based grating spectrometer for wavelength-division multiplexed systems at 1.5 mu m
Author :
Soole, J.B.D. ; Scherer, Axel ; Leblanc, Herve P. ; Andreadakis, N.C. ; Bhat, Ritesh ; Koza, M.A.
Author_Institution :
Bellcore, Red Bank, NJ, USA
Abstract :
A monolithic InP-based grating spectrometer for use in wavelength-division multiplexed systems at 1.5 mu m is reported. The spectrometer uses a single etched reflective focusing diffraction grating and resolves >50 channels at 1 nm spacing with a approximately 0.3 nm channel width and at least 19 dB channel isolation. Operation is essentially of the state of the input polarisation.
Keywords :
III-V semiconductors; diffraction gratings; frequency division multiplexing; indium compounds; integrated optics; interference spectrometers; multiplexing equipment; optical communication equipment; optical waveguide components; 1.5 micron; InP-InGaAsP; InP-based grating spectrometer; WDM; etched reflective grating; focusing diffraction grating; monolithic type; wavelength-division multiplexed systems;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910087
