• DocumentCode
    1318474
  • Title

    High-power, highly-reliable operation of InGaAs/InGaAsP 0.98 μm lasers with an exponential-shaped flared stripe

  • Author

    Sagawa, M. ; Hiramoto, K. ; Toyonaka, T. ; Kikawa, T. ; Fujisaki, S. ; Uomi, K.

  • Author_Institution
    Central Res. Labs., Hitachi Ltd., Tokyo, Japan
  • Volume
    32
  • Issue
    24
  • fYear
    1996
  • fDate
    11/21/1996 12:00:00 AM
  • Firstpage
    2277
  • Lastpage
    2279
  • Abstract
    A 0.98 μm InGaAs/InGaAsP/GaAs strained quantum-well laser with an exponential-shaped-flared stripe has been developed. Its maximum output power is 40-60% higher than that of ordinary straight-stripe lasers for the same kink-occurrence output power. Testing at 150 mW showed stable operation with an estimated lifetime of >200000 h
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser stability; laser transitions; quantum well lasers; semiconductor device reliability; 0.98 micron; 150 mW; 200000 hr; InGaAs-InGaAsP-GaAs; exponential-shaped flared stripe; high-power operation; highly-reliable operation; stable operation; strained quantum-well laser;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19961483
  • Filename
    556814