Title :
Interelectrode capacitance nonlinearities in vertical power DMOSFETs
Author_Institution :
Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
Abstract :
Extensive numerical simulations were performed to understand interelectrode capacitance characteristics of vertical power DMOSFETs. Two-dimensional simulations indicate large capacitance-voltage nonlinearities, especially for the gate-to-drain Miller capacitance Cgd. Capacitance-voltage characteristics are explained in terms of a simple equivalent circuit that relates each capacitance component to its physical origin.
Keywords :
capacitance; equivalent circuits; insulated gate field effect transistors; power transistors; semiconductor device models; capacitance-voltage nonlinearities; equivalent circuit; gate-to-drain Miller capacitance; interelectrode capacitance characteristics; numerical simulations; vertical power DMOSFETs;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910178