DocumentCode :
1319141
Title :
Interelectrode capacitance nonlinearities in vertical power DMOSFETs
Author :
Shenai, Krishna
Author_Institution :
Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
Volume :
27
Issue :
3
fYear :
1991
Firstpage :
280
Lastpage :
282
Abstract :
Extensive numerical simulations were performed to understand interelectrode capacitance characteristics of vertical power DMOSFETs. Two-dimensional simulations indicate large capacitance-voltage nonlinearities, especially for the gate-to-drain Miller capacitance Cgd. Capacitance-voltage characteristics are explained in terms of a simple equivalent circuit that relates each capacitance component to its physical origin.
Keywords :
capacitance; equivalent circuits; insulated gate field effect transistors; power transistors; semiconductor device models; capacitance-voltage nonlinearities; equivalent circuit; gate-to-drain Miller capacitance; interelectrode capacitance characteristics; numerical simulations; vertical power DMOSFETs;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19910178
Filename :
83256
Link To Document :
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