Title :
Single event effects in pulse width modulation controllers
Author :
Penzin, S.H. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Kirshman, J.F. ; Koga, R.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed using both Set-Reset (SR) flip-flops and Toggle (T) flip-flops which are vulnerable to single event upset (SEU) in a radiation environment. Depending on the implementation of the different devices the effect can be significant in spaceflight hardware
Keywords :
controllers; flip-flops; ion beam effects; power system control; pulse width modulation; switched mode power supplies; SEE testing; pulse width modulation controller; radiation environment; set-reset flip-flop; single event upset; spaceflight hardware; switching mode power supply; toggle flip-flop; Control systems; Flip-flops; Hardware; Performance evaluation; Pulse width modulation; Pulsed power supplies; Single event upset; Space vector pulse width modulation; Strontium; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
