• DocumentCode
    1319294
  • Title

    Mechanism of anomalous degradation of silicon solar cells subjected to high-fluence irradiation

  • Author

    Ohshima, Takeshi ; Morita, Yousuke ; Nashiyama, Isamu ; Kawasaki, Osamu ; Hisamatsu, Tadashi ; Nakao, Tetsuya ; Wakow, Yoshihito ; Matsuda, Sumio

  • Author_Institution
    JAERI, Gunma, Japan
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2990
  • Lastpage
    2997
  • Abstract
    We have found anomalous degradation of electrical performance in silicon solar cells designed for space use due to high-fluence irradiation of charged particles, e.g., 1 MeV-electrons of ~1017 e/cm2 and 10 MeV-protons of ~1014 p/cm2. This anomalous degradation has two typical features, i.e., sudden-drop-down of electrical performances and slight recovery of the short circuit current ISC just before the sudden-drop-down, which cannot be explained by a conventional model based on decrease of the minority-carrier life-time. In order to account for these features, we propose a new model, in which decreases of the majority-carrier concentration and the minority-carrier mobility are considered in addition to that of the minority-carrier life-time. The anomalous degradation observed is well represented by this model
  • Keywords
    aerospace testing; carrier lifetime; carrier mobility; electric properties; electron beam effects; proton effects; semiconductor device models; semiconductor device reliability; semiconductor device testing; silicon; solar cells; 1 MeV; 10 MeV; MeV-electrons; MeV-protons; Si; anomalous degradation; charged particles; electrical performance; high-fluence irradiation; majority-carrier concentration; minority-carrier life-time; minority-carrier mobility; short circuit current; silicon solar cells; space use; sudden-drop-down; Degradation; Electrons; Gallium arsenide; Photovoltaic cells; Power supplies; Protons; Satellites; Short circuit currents; Silicon; Space charge;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556896
  • Filename
    556896