Title :
Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations
Author :
Barnaby, W. ; Tausch, H.J. ; Turfler, R. ; Cole, P. ; Baker, P. ; Pease, R.L.
Author_Institution :
Mission Res. Corp., Albuquerque, NM, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
A methodology is presented for the identification of circuit total dose response mechanisms in bipolar linear microcircuits irradiated at high and low dose rates. This methodology includes manual circuit analysis, circuit simulations with SPICE using extracted device parameters, and selective irradiations of portions of the circuit using a scanning electron microscope
Keywords :
SPICE; bipolar analogue integrated circuits; circuit analysis computing; electron beam effects; gamma-ray effects; integrated circuit testing; scanning electron microscopy; SPICE; bipolar linear circuit; circuit analysis; circuit response mechanisms; circuit simulations; dose rates; extracted device parameters; gamma-ray effects; scanning electron microscope; total dose irradiations; Circuit analysis; Circuit simulation; Cranes; Degradation; Failure analysis; Linear circuits; Manuals; SPICE; Scanning electron microscopy; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
