DocumentCode :
1320092
Title :
Steady state thermal characterization and junction temperature estimation of multichip module packages using the response surface method
Author :
Zahn, Bret A.
Author_Institution :
ChipPAC Inc., Chandler, AZ, USA
Volume :
23
Issue :
1
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
33
Lastpage :
39
Abstract :
The steady state thermal performance of semiconductor packages has been traditionally reported through the utilization of a single junction-to-ambient thermal resistance constant commonly referred to as θja. This is particularly inadequate for multichip modules where several devices reside within the same package structure. This paper discusses how a central composite design of experiments can be applied to provide a more accurate thermal characterization of a multichip module package. The end product is a series of linear or polynomial equations which can be utilized by the customer to calculate individual device junction temperatures over a wide variation of convection cooling environments and multiple device power dissipations. A 352 plastic ball grid array package, which encompasses three individual integrated circuit devices, is used as an example. The paper steps through the sensitivity analysis and evaluates the accuracy of the resulting equations. This method of thermal characterization can be easily applied to single chip modules of varying power and cooling regimes, or multiple output devices where several power junctions reside within the same integrated circuit
Keywords :
ball grid arrays; convection; cooling; integrated circuit packaging; multichip modules; plastic packaging; sensitivity analysis; surface fitting; convection cooling environments; cooling regimes; device junction temperatures; junction temperature estimation; linear equations; multichip module packages; multiple device power dissipations; plastic ball grid array package; polynomial equations; response surface method; sensitivity analysis; steady state thermal characterization; Cooling; Equations; Integrated circuit packaging; Multichip modules; Polynomials; Power dissipation; Semiconductor device packaging; Steady-state; Temperature sensors; Thermal resistance;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.833039
Filename :
833039
Link To Document :
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