Title :
On n-detection test sets and variable n-detection test sets for transition faults
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fDate :
3/1/2000 12:00:00 AM
Abstract :
We study the effectiveness of n-detection test sets based on transition faults in detecting defects that affect the timing behavior of a circuit. We use path delay faults as surrogates for unmodeled defects, and show that the path delay fault coverage achieved by an n-detection transition fault test set increases significantly as n is increased. We also introduce a method to reduce the number of tests included in an n-detection test set by using different values of n for different faults based on their potential effect on the defect coverage. The resulting test sets are referred to as variable n-detection test sets
Keywords :
automatic test pattern generation; integrated circuit testing; logic testing; timing; ATPG; defects detection; delay fault coverage; n-detection test sets; path delay faults; timing behavior; transition faults; variable n-detection test sets; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Delay; Electrical fault detection; Fault detection; Logic circuits; Timing; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
