DocumentCode :
1321236
Title :
Choice of clip levels for beam width measurements using knife-edge techniques
Author :
Siegman, Anthony E. ; Sasnett, M.W. ; Johnston, T.F., Jr.
Author_Institution :
Stanford Univ., CA, USA
Volume :
27
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
1098
Lastpage :
1104
Abstract :
The scanning knife-edge technique provides a method for measuring the width of an optical beam having an arbitrary or irregular transverse profile. To implement this method, however, it is necessary to select both a clip level and a scale factor for converting the measured clip width into an effective width of the laser beam. The authors show that the preferred clip level for beam width measurements using this technique should be chosen in the range between 8.5% and about 11.6%. With a suitably matched clip level and scale factor within this range, the conversion from measured clip width to standard deviation can be made exactly accurate for TEM00 Gaussian beams, and the conversion factor will become only slightly inaccurate for a wide range of other higher-order or poorer-quality beam profiles
Keywords :
laser beams; laser variables measurement; Gaussian beams; arbitrary profile; beam profiles; beam width measurements; clip levels; conversion factor; effective width; irregular transverse profile; laser beam; measured clip width; optical beam; scale factor; scanning knife-edge technique; Analysis of variance; Laser beams; Laser theory; Measurement standards; Measurement techniques; Optical beams; Optical propagation; Photodetectors; Shape;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.83346
Filename :
83346
Link To Document :
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