Title :
Bias: A Network Analysis Computer Program Useful to the Reliability Engineer
Author :
Willows, James L., Jr. ; Magnuson, Waldo G., Jr.
Author_Institution :
Lawrence Radiation Laboratory, Livermore, Calif. 94550.
Abstract :
This paper briefly describes the Bias program1 and its application in reliability analysis. Except in the simplest of networks, the calculation of parameters for reliability analyses is not easily achieved. Because of the easy temperature variation and other features of the network analysis program Bias, it is extremely well suited to at least three commonly used reliability analysis procedures: failure mode and criticality, drift failure, reliability prediction (catastrophic failures).
Keywords :
Circuits; Computer network reliability; Computer networks; Failure analysis; Reliability engineering; Resistors; Semiconductor diodes; Temperature dependence; Transistors; Voltage;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1971.5216108