DocumentCode :
1322491
Title :
Lower Confidence Limits for Availability Assuming Lognormally Distributed Repair Times
Author :
Gray, Henry L. ; Schucany, William R.
Author_Institution :
LTV Electrosystems, Inc., Greenville, Tex.; Texas Technological college, Lubbock, Tex.
Issue :
4
fYear :
1969
Firstpage :
157
Lastpage :
162
Abstract :
Exact lower confidence limits are established for the availability ratio A where A = ¿y/(¿y + ¿x) and ¿y is the mean time between failures and ¿x is the mean time to repair. It is assumed that the time between failures has an exponential distribution while the time to repair is log-normally distributed, with known variance. A test of the hypothesis A = Ao is also developed and power curves are included. Some results on the comparison of confidence intervals when the time to repair is assumed to be exponentially distributed are given.
Keywords :
Availability; Exponential distribution; Failure analysis; Gaussian distribution; Manufacturing; Probability distribution; Random variables; Reactive power; Reliability engineering; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1969.5216343
Filename :
5216343
Link To Document :
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