• DocumentCode
    13225
  • Title

    Analysis of Waveguide Effects on the Free Electron Laser Gain

  • Author

    Qika Jia

  • Author_Institution
    Nat. Synchrotron Radiat. Lab., Univ. of Sci. & Technol. of China, Hefei, China
  • Volume
    49
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    309
  • Lastpage
    313
  • Abstract
    Using an approach unlike that in the literature, the effects induced by waveguides on the gain in infrared free-electron lasers are analyzed for both the low and the high gain regimes. By analyzing the relation of the detuning parameter to the radiation frequency and the waveguide parameter, the radiation frequency and the slippage are analyzed not merely for the resonance case, but for more general cases. Their dependence on the waveguide parameter is analytically presented for an arbitrary value of the detuning, the features of the gain and the requirements for the waveguide parameter can be easily revealed. It is found that the derivative of the detuning parameter with respect to the radiation wavenumber is proportional to the slippage. The analysis shows that the zero slippage always exists, and to have gain at the zero-slippage frequency corresponds to obtaining a gain curve with a single broadband peak. This can be realized for both the high gain and the low gain regions by choosing the appropriate dimension of the waveguide. It is also shown that the higher order modes of the waveguide have greater effect on the high gain than on the low gain regime.
  • Keywords
    free electron lasers; optical waveguides; detuning parameter; free electron laser gain; infrared free-electron lasers; radiation frequency; radiation wavenumber; single broadband peak; waveguide effects; waveguide parameter; zero-slippage frequency; Bandwidth; Free electron lasers; Optical waveguides; Resonant frequency; Undulators; Waveguide discontinuities; Waveguide lasers; Free-electron laser; waveguide;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2013.2240654
  • Filename
    6413162