Title :
Triggering of Transient Latch-up by System-Level ESD
Author :
Brodbeck, Tilo ; Stadler, Wolfgang ; Baumann, Christian ; Esmark, Kai ; Domanski, Krzysztof
Author_Institution :
Infineon Technol. AG, Munich, Germany
Abstract :
This paper investigates the influences of temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system-level surges as, e.g., seen in cable discharge events, even very short trigger pulses can cause TLU.
Keywords :
electrostatic discharge; integrated circuit testing; IC LU test; TLU triggering; cable discharge event; high discharge current; integrated circuit latch-up test; system-level ESD; system-level surge; transient latch-up triggering; transient trigger parameter; very short trigger pulse; Electrostatic discharge; Power supplies; Pulse circuits; Temperature measurement; Thyristors; Transient analysis; Cable discharge event (CDE); electrostatic discharge (ESD); latch-up (LU); system-level ESD; transient LU (TLU); transition line pulse (TLP);
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2011.2165072
