Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices

Author

Deschrijver, Dirk ; Vanhee, Filip ; Pissoort, Davy ; Dhaene, Tom

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium

Volume

54

Issue

3

fYear

2012

fDate

6/1/2012 12:00:00 AM

Firstpage

502

Lastpage

510

Abstract

This paper presents an automated procedure to determine the electric or magnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example.

Keywords

electromagnetic compatibility; printed circuits; EMC analysis; automated near-field scanning algorithm; electric near-field profile; electronic devices; electronic systems; magnetic near-field profile; near-field scan points optimal coordinates; printed circuit board example; scanning plane; sequential sampling; Algorithm design and analysis; Approximation methods; Computational modeling; Data models; Electromagnetic compatibility; Noise measurement; Probes; Electromagnetic compatibility (EMC); Kriging; near-field (NF) scanning; sequential sampling; surrogate modeling;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2011.2163821

Filename

6024456