DocumentCode :
1325974
Title :
5 MHz phase detector with low residual flicker
Author :
Barnes, C.A. ; Hati, Archita ; Nelson, Craig ; Howe, David A.
Author_Institution :
Dept. of Commerce, Nat. Inst. of Stand. & Technol., Time & Freq. Metrol., Boulder, CO, USA
Volume :
47
Issue :
19
fYear :
2011
Firstpage :
1066
Lastpage :
1067
Abstract :
The measurement of close-to-carrier phase modulation (PM) noise of state-of-the-art oscillators is always challenging. Quite often the residual noise of the phase detector used in these measurements is higher than the noise of the source at Fourier offset frequencies between 5 and 100 Hz. A conventional double balanced mixer using 2N2222A transistors as the nonlinear components of a diode ring was constructed for use as a phase detector. Residual single-sideband PM noise measurements at 5 MHz for this device have shown a low flicker noise floor of L(10 Hz) = -163 dBc/Hz. When this mixer design is implemented in a dual-channel measurement system, a cross-correlated PM noise floor of better than L(10 Hz) = -170 dBc/Hz is expected.
Keywords :
Fourier transforms; diodes; electric noise measurement; flicker noise; measurement systems; mixers (circuits); phase detectors; phase modulation; radiofrequency oscillators; 2N2222A transistors; Fourier offset frequency; close-to-carrier phase modulation noise measurement; diode ring; double balanced mixer; dual-channel measurement system; frequency 5 MHz; mixer design; nonlinear components; oscillator; phase detector; residual flicker; residual single-sideband PM noise measurement;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2011.1863
Filename :
6025135
Link To Document :
بازگشت