• DocumentCode
    132808
  • Title

    A testability growth model and its application

  • Author

    Chenxu Zhao ; Jing Qiu ; Guanjun Liu ; Kehong Lv ; Pattipati, K.

  • Author_Institution
    Sci. & Technol. on Integrated Logistics Support Lab., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2014
  • fDate
    15-18 Sept. 2014
  • Firstpage
    121
  • Lastpage
    128
  • Abstract
    Testability growth is the enhancement in system testability through design modifications and/or other corrective actions performed throughout a system´s life cycle. A testability growth model can help system designers to plan and execute a testability progression process, and to achieve the specified system testability metrics in minimum time and/or cost. A Markov chain-based testability growth model that tracks and projects a user-defined composite testability growth metric is proposed. A Bayesian approach and a hybrid genetic algorithm, coupled with a particle swarm optimization method, are used to learn the parameters of the testability growth model from evolving data, and use the estimated model to track and project the testability metric. Validation of the theory is provided via simulated data. Results show that the testability growth model is reasonable, and the accuracy of the method is quite good.
  • Keywords
    Bayes methods; Markov processes; design for testability; failure analysis; genetic algorithms; particle swarm optimisation; Bayesian approach; Markov chain-based testability growth model; design modifications; hybrid genetic algorithm; particle swarm optimization method; system life cycle; system testability metrics; testability progression process; user defined composite testability growth metric; Bayes methods; Discrete Fourier transforms; Markov processes; Measurement; Software reliability; Testing; Baysesian; Markov chain; design for testability; genetic algorithm; particle swarm optimization; testability growth;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2014 IEEE
  • Conference_Location
    St. Louis, MO
  • Print_ISBN
    978-1-4799-3389-1
  • Type

    conf

  • DOI
    10.1109/AUTEST.2014.6935132
  • Filename
    6935132