DocumentCode
132809
Title
The true nature of false alarms
Author
Ungar, Louis Y.
Author_Institution
A.T.E. (Adv. Test Eng.) Solutions, Inc., El Segundo, CA, USA
fYear
2014
fDate
15-18 Sept. 2014
Firstpage
129
Lastpage
135
Abstract
False alarms are frustrating test and diagnostic complications. Finding more faults than actually exist within a unit under test (UUT) results in increased costs, unnecessary and longer down times, and loss of confidence by the end user. In this paper we deviate from the classical definition of false alarm and replace it with a pragmatic one that measures the maintenance actions taken as a result of invalid failure indications. This helps formulate various false alarm metrics and explores the proximate causes of false alarms from cannot duplicate (CND) and retest OK (RTOK) events. It demonstrates why the fraction of false alarm (FFA) specified for systems (usually at <;10%) is out of scope with empirical results found at maintenance sites, where returns caused by false alarms tend to be >70%. This huge discrepancy between expectations and results are partly due to definitions of terms and the difficulty to develop proper and verifiable metrics. Using Bayes formula as well as other metrics, however, this paper develops formulas for occurrence of false alarms (OFA) and cost of false alarms (CFA) for various CND and RTOK events. The paper includes typical examples that illustrate a match between the formulas and empirical results. Finally, the paper offers practical strategies for mitigating occurrences and costs resulting from false alarm indications.
Keywords
Bayes methods; automatic test equipment; cost reduction; failure analysis; maintenance engineering; smoke detectors; Bayes formula; CFA; CND; FFA; OFA; RTOK; UUT; cannot duplicate; cost mitigation; cost of false alarms; failure indications; false alarm metrics; maintenance actions; occurrence of false alarms; retest OK; unit under test; verifiable metrics; Equations; Maintenance engineering; Mathematical model; Measurement uncertainty; Probability; Test equipment; Type I and Type II errors; diagnoses; electronics test; support and maintenance;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2014 IEEE
Conference_Location
St. Louis, MO
Print_ISBN
978-1-4799-3389-1
Type
conf
DOI
10.1109/AUTEST.2014.6935133
Filename
6935133
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