Title :
Using a common test infrastructure for standardized interfaces
Author :
Yucesoy, Veysel ; Demir, Fatih ; Durusu, Deniz
Author_Institution :
Test Syst. & Process Design Dept., ASELSAN Inc., Ankara, Turkey
Abstract :
During the last decade, VME, VXS, VPX and cPCI became the leading interfaces among those are used especially in military computers. Due to this fact, there exists a large variety of boards which contain one of the listed interfaces. The power specifications of these interfaces are similar. In addition to this, physical dimensions are also standardized (i.e. 3U and 6U standards). Especially for ASELSAN, a large portion of the boards having one of these interfaces also have common electrical interfaces like CAN, discrete IO or serial buses. Due to high power consumption and utilization of CPUs/FPGAs, these boards also have to be cooled during test process. These common properties of the standards and similar test requirements of the boards immediately bring the idea of a common test infrastructure.
Keywords :
automatic test equipment; field buses; field programmable gate arrays; military equipment; military standards; ASELSAN; CPU; FPGA; common test infrastructure; electrical interfaces; military computers; standardized interface; test process; test requirements; Computers; Connectors; Light emitting diodes; Power supplies; Standards; Switches; Test equipment; ATS/TPS Management; Common Test Infrastructure; VME; VPX; VXS; cPCI;
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
DOI :
10.1109/AUTEST.2014.6935161